The Resource A one-semester course in modeling of VLSI interconnections, Ashok K. Goel

A one-semester course in modeling of VLSI interconnections, Ashok K. Goel

Label
A one-semester course in modeling of VLSI interconnections
Title
A one-semester course in modeling of VLSI interconnections
Statement of responsibility
Ashok K. Goel
Title variation
A one-semester course in modeling of very large-scale integration interconnections
Creator
Author
Subject
Language
eng
Summary
Quantitative understanding of the parasitic capacitances and inductances, and the resultant propagation delays and crosstalk phenomena associated with the metallic interconnections on the very large scale integrated (VLSI) circuits has become extremely important for the optimum design of the state-of-the-art integrated circuits. More than 65 percent of the delays on the integrated circuit chip occur in the interconnections and not in the transistors on the chip. Mathematical techniques to model the parasitic capacitances, inductances, propagation delays, crosstalk noise, and electromigration-i
Member of
Cataloging source
UMI
Dewey number
621.392
Illustrations
illustrations
Index
index present
LC call number
TK7874
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Series statement
Momentum Press electronic circuits and semiconductor devices collection
Label
A one-semester course in modeling of VLSI interconnections, Ashok K. Goel
Publication
Copyright
Bibliography note
Includes bibliographical references and index
http://library.link/vocab/branchCode
  • net
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
  • A One-Semester Course in Modeling of VLSI Interconnections; Dedication; Table of Contents; Preface; Acknowledgments; CHAPTER 1: Introductory Concepts; CHAPTER 2: Modeling of Interconnection Resistances, Capacitances, and Inductances; CHAPTER 3: Modeling of Interconnection Delays; CHAPTER 4: Modeling of InterconnectionCrosstalk; CHAPTER 5: Modeling of Electromigration-Induced Interconnection Failure; CHAPTER 6: Other Interconnection Technologies; APPENDIX A: Tables of Constants; APPENDIX B: Method of Images; APPENDIX C: Method of Moments; APPENDIX D: Transmission Line Equations
  • APPENDIX E: Miller's TheoremAPPENDIX F: Inverse Laplace Transformation Technique; Index; Ad page
Control code
ocn900898190
Dimensions
unknown
Extent
1 online resource (1 volume)
Form of item
online
Isbn
9781606505137
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
http://library.link/vocab/ext/overdrive/overdriveId
cl0500000541
http://library.link/vocab/recordID
.b32143795
Sound
unknown sound
Specific material designation
remote
System control number
  • (OCoLC)900898190
  • pebc1606505130

Library Locations

    • Deakin University Library - Geelong Waurn Ponds CampusBorrow it
      75 Pigdons Road, Waurn Ponds, Victoria, 3216, AU
      -38.195656 144.304955
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