The Resource Optical scattering : measurement and analysis, John C. Stover

Optical scattering : measurement and analysis, John C. Stover

Label
Optical scattering : measurement and analysis
Title
Optical scattering
Title remainder
measurement and analysis
Statement of responsibility
John C. Stover
Creator
Contributor
Subject
Language
eng
Summary
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable
Member of
Cataloging source
KNOVL
Dewey number
535/.4
Illustrations
illustrations
Index
index present
LC call number
QC427.4
LC item number
.S76 1995eb
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Series statement
SPIE Press monograph
Series volume
PM24
Label
Optical scattering : measurement and analysis, John C. Stover
Publication
Note
"SPIE Digital Library."--Website
Antecedent source
file reproduced from original
Bibliography note
Includes bibliographical references (pages 283-302)
http://library.link/vocab/branchCode
  • net
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Preface to the first edition -- Preface to the second edition -- Acknowledgments for the second edition -- Preface to the third edition -- Acknowledgments for the third edition -- List of acronyms -- Chapter 1. Quantifying light scatter -- Chapter 2. Quantifying surface roughness -- Chapter 3. Scatter calculations and diffraction theory -- Chapter 4. Using Rayleigh-Rice to calculate smooth-surface statistics from the BRDF -- Chapter 5. Polarization of scattered light -- Chapter 6. Scattering models for discrete surface features -- Chapter 7. Instrumentation and measurement issues -- Chapter 8. Predicting scatter from roughness -- Chapter 9. Detection of discrete defects -- Chapter 10. Appearance and scattered light -- Chapter 11. Industrial applications -- Chapter 12. Published scatter standards -- Chapter 13. Scatter specifications -- Appendix A. Review of electromagnetic wave propagation -- Appendix B. Kirchhoff diffraction from sinusoidal gratings -- Appendix C. BSDF data -- Appendix D. Units -- References -- Works consulted
Control code
ocn805233701
Dimensions
unknown
Edition
3rd ed
Extent
1 online resource (xxiv, 302 pages)
Form of item
online
Isbn
9780819492524
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1117/3.975276
Other physical details
illustrations, digital file
http://library.link/vocab/recordID
.b36996518
Specific material designation
remote
System control number
  • (OCoLC)805233701
  • spie0819492523

Library Locations

    • Deakin University Library - Geelong Waurn Ponds CampusBorrow it
      75 Pigdons Road, Waurn Ponds, Victoria, 3216, AU
      -38.195656 144.304955
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