The Resource Optical scattering : measurement and analysis, John C. Stover

Optical scattering : measurement and analysis, John C. Stover

Label
Optical scattering : measurement and analysis
Title
Optical scattering
Title remainder
measurement and analysis
Statement of responsibility
John C. Stover
Creator
Contributor
Subject
Language
eng
Summary
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable
Member of
Cataloging source
KNOVL
Dewey number
535/.4
Illustrations
illustrations
Index
index present
LC call number
QC427.4
LC item number
.S76 1995eb
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Series statement
SPIE Press monograph
Series volume
PM24
Label
Optical scattering : measurement and analysis, John C. Stover
Publication
Bibliography note
Includes bibliographical references (pages 303-317) and index
http://library.link/vocab/branchCode
  • net
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
  • Chapter 1. Introduction to light scatter: 1.1 The scattering of light -- 1.2 Scatter from a smooth sinusoidal surface -- 1.3 Scatter from other surfaces -- 1.4 Scatter from windows and particulates -- 1.5 Bidirectional scatter distribution functions -- 1.6 Total integrated scatter -- 1.7 Summary
  • Chapter 10. Scatter specifications: 10.1 Generic specifications -- 10.2. Calculation of specifications for several examples -- 10.3. Summary -- Appendix A. Review of electromagnetic wave propagation -- A. 1 The wave equation -- A.2 Electromagnetic plane waves in free space -- A.3 Plane waves in a dielectric -- A.4 Plane waves.in a conducting medium -- Appendix B. Kirchhoff diffraction from sinusoidal gratings -- Appendix C. BSDF data -- Bibliography -- Index
  • Chapter 2. Surface roughness: 2.1 Profile characterization -- 2.2 The surface power spectral-- Density and autocovariance functions -- 2.3 Summary
  • Chapter 3. Scatter calculations and diffraction theory: 3.1. Overview -- 3.2. Kirchhoff diffraction theory -- 3.3. The Rayleigh approach -- 3.4. Comparison of vector and scalar results -- 3.5. Summary
  • Chapter 4. Calculation of smooth-surface statistics from the BRDF: 4.1. Practical application of the Rayleigh-Rice perturbation theory -- 4.2. Roughness statistics of isotropic surfaces -- 4.3. Roughness statistics of one-dimensional surfaces -- 4.4. Roughness statistics for the general case -- 4.5. The K-correlation surface power spectrum models -- 4.6. The TIS derivation from the Rayleigh-Rice perturbation theory -- 4.7. Summary
  • Chapter 5. Polarization of scattered light: 5.1. A review of polarization concepts -- 5.2. The polarization factor Q -- 5.3. Scattering vectors and matrices -- 5.4. Summary
  • Chapter 6. Scatter measurements and instrumentation: 6.1. Scatterometer components -- 6.2. Instrument signature -- 6.3. Aperture effects on the measured BSDF -- 6.4. Signature reduction and near-specular measurements -- 6.5. The noise-equivalent BSDF -- 6.6. Measurement of P. and instrument calibration -- 6.7. Measurement of curved optics -- 6.8. Coordinate systems and out-of-plane measurements -- 6.9. Raster scans -- 6.10. Measurement of retroreflection -- 6.11. Alternate TIS devices -- 6.12. Error analysis of the measured BSDF -- 6.13. Summary
  • Chapter 7. Scatter predictions: 7.1. Optical surfaces: using the Rayleigh-Rice equation -- 7.2. Rough surfaces -- 7.3. Partial data sets -- 7.4. Scatter from diffuse samples -- 7.5. BRDF standard surfaces -- 7.6. Software for prediction of scatter in optical systems -- 7.7. Summary
  • Chapter 8. Detection of Discrete Surface and Subsurface Defects: 8.1. Polarization effects associated with defect scatter -- 8.2. Bulk defects in transparent optics -- 8.3. Near-point-scatter sources and differential-scattering cross section -- 8.4. Nontopographic defects in opaque materials -- 8.5. Summary
  • Chapter 9. Industrial applications: 9.1 Semiconductor applications -- 9.2. Computer disks -- 9.3. Contamination measurement by wavelength discrimination -- 9.4. General manufacturing examples -- 9.5. Summary
Control code
ocn695027107
Dimensions
unknown
Edition
2nd ed
Extent
1 online resource (xiii, 321 pages)
Form of item
online
Isbn
9780819478443
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1117/3.203079
Other physical details
illustrations
http://library.link/vocab/recordID
.b36995654
Specific material designation
remote
System control number
  • (OCoLC)695027107
  • spie0819419346

Library Locations

    • Deakin University Library - Geelong Waurn Ponds CampusBorrow it
      75 Pigdons Road, Waurn Ponds, Victoria, 3216, AU
      -38.195656 144.304955
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